TDDB
Time-Dependent Dielectric Breakdown
TDDB is the degradation of a dielectric under electrical stress over time, eventually causing it to lose its insulating function.
Other learning contexts (2)
In context
The generation and accumulation of defects can create paths for current flow. Interpret the electric field, temperature, film quality, thickness, area, test conditions, and other factors together.
Example
Initial leakage within the allowable range does not automatically guarantee long-term insulation. Conversely, converting accelerated test results into an actual lifetime requires a suitable model and conditions.
Key distinction
Dielectric reliability addresses both the initial state and degradation over time.
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