Electromigration
EM
Electromigration is the movement of metal atoms promoted by current flow.
Other learning contexts (6)
In context
Voids or protrusions can form during prolonged use, increasing the risk of open or short circuits. Current density, temperature, material, crystal structure, interfaces, and other conditions affect lifetime.
Example
Even interconnects with similar initial resistance can behave differently over time if their fill defects, grains, or interfaces differ. Initial electrical testing alone does not establish equal lifetimes.
Key distinction
Distinguish the ability to carry current from the ability to carry it stably over a long period.
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